JPS6324453Y2 - - Google Patents

Info

Publication number
JPS6324453Y2
JPS6324453Y2 JP1982037368U JP3736882U JPS6324453Y2 JP S6324453 Y2 JPS6324453 Y2 JP S6324453Y2 JP 1982037368 U JP1982037368 U JP 1982037368U JP 3736882 U JP3736882 U JP 3736882U JP S6324453 Y2 JPS6324453 Y2 JP S6324453Y2
Authority
JP
Japan
Prior art keywords
semiconductor device
mini
test board
semiconductor devices
leads
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1982037368U
Other languages
English (en)
Japanese (ja)
Other versions
JPS58140479U (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP3736882U priority Critical patent/JPS58140479U/ja
Publication of JPS58140479U publication Critical patent/JPS58140479U/ja
Application granted granted Critical
Publication of JPS6324453Y2 publication Critical patent/JPS6324453Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP3736882U 1982-03-16 1982-03-16 半導体装置の特性測定装置 Granted JPS58140479U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3736882U JPS58140479U (ja) 1982-03-16 1982-03-16 半導体装置の特性測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3736882U JPS58140479U (ja) 1982-03-16 1982-03-16 半導体装置の特性測定装置

Publications (2)

Publication Number Publication Date
JPS58140479U JPS58140479U (ja) 1983-09-21
JPS6324453Y2 true JPS6324453Y2 (en]) 1988-07-05

Family

ID=30048760

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3736882U Granted JPS58140479U (ja) 1982-03-16 1982-03-16 半導体装置の特性測定装置

Country Status (1)

Country Link
JP (1) JPS58140479U (en])

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5917870U (ja) * 1982-07-24 1984-02-03 利昌工業株式会社 フラット型半導体パッケージ試験用基板
JPH07111992B2 (ja) * 1987-06-24 1995-11-29 東京エレクトロン株式会社 素子収納用トレイ

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54147172U (en]) * 1978-04-04 1979-10-13

Also Published As

Publication number Publication date
JPS58140479U (ja) 1983-09-21

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